Overview
The complete correlation & spectroscopy analysis software solution for microscopy
Go from microscopy to spectral analysis in a single workflow
The new Wiley Surface-to-Spectral Analysis provides a comprehensive, powerful solution to process, combine, and analyze images and data from various microscopic techniques. Designed to make your lab more efficient, you can do it all in a single interface:
- Spectral Processing and Analysis
- Spectral Map and Image Processing
- Correlative Analysis
- 3D Visualization of 2D Compositional Data
Users can even take their analysis a step further by sending spectra to Wiley's KnowItAll software* to search against spectral libraries for further investigation.
Comprehensive, integrated tools for efficient analysis | Flexible, vendor neutral technology for easy integration | Gain key insights faster with a single workflow |
Powerful toolsets designed to ensure you can thoroughly process and analyze your surface images. |
Supports multiple file & instrument formats, so even if you change instruments or microscopes, your workflow remains intact. |
Go direct from microscopy to spectral analysis —all within a single workflow to reach conclusions faster. |
Supported techniques include:
- Raman
- TERS
- IR
- nanoIR
- fluorescence
- photoluminescence
- cathodoluminescence
- EDX/EDS and XPS
- With adds-ons for SEM, SPM, Particle Analysis, Profilometry
See compatibility tab for listings of supported formats.
* Requires license to KnowItAll software and libraries.
Details
Below are further details on all the features included in each package.
Wiley Surface-to-Spectral Analysis – Basic Package
Key Features
- Spectral Processing and Analysis
- Spectral Map and Image Processing
- Correlative Analysis
- 3D Visualization of 2D Compositional Data
- Available Product Enhancements & Add-On Support for Microscopies
⇒ Spectral Processing and Analysis
- Visualize and analyze spectral series and hyperspectral images
- Create spectral maps from user selected spectral bands
- Generate parameter maps
- Apply multivariate analysis to find significant spectra and their distribution
- Processing methods include: baseline corrections, filtering, peak fitting
- One-button-click to send spectra into KnowItAll IDExpert* for database searching including Raman, IR (FTIR, ATR, NIR) and UV-Vis
*Requires license to KnowItAll software and libraries.
⇒ Spectral Map and Image Processing
- Process spectral maps for Raman, cathodoluminescence, photoluminescence, fluorescence, EDX/EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy loss spectroscopy)
- Processing methods for spectral maps include: color mixing of layers, adjust image noise, adjust transparency between layers
- Processing methods for images include: apply visual corrections and enhancements, smoothing, remove artifacts
⇒ Correlative Analysis
- Associate images and spectral maps from a single instrument or multiple instruments (Raman, EDS/EDX, cathodoluminescence, fluorescence, etc.)
- Adjoin information from different sources into a single, multifaceted dataset
⇒ 3D Visualization of 2D Compositional Data
- Create 3D visualizations of 2D chemical maps by associating microscopy images or topography data
Add-Ons: Product Enhancements & Support for Additional Microscopies
Support for alternative microscopes is available with the following add-ons. See
⇒ SEM Add-On
Provides support for scanning electron microscopy (SEM) images:
- Group colorization of features
- Image corrections and enhancements
- Accurate height and surface roughness calculations
- Generate 3D rendering from images
- Associate EDX/EDS data to images
⇒ SPM Add-On
SPM enables support for scanning probe microscopy (STM, AFM, etc.) file formats and multi-channel data:
- Advanced processing (line-by-line leveling, spatial filter, surface division, tip deconvolution, line correction, multiplane leveling)
- Math function operators
⇒ Particle Analysis Add-On
Particle Analysis provides a comprehensive toolset for analyzing particles, pores, grains, islands, etc., on structured surfaces:
- Feature detection based on different segmentation principles
- Group particles based on shape, height, or size
- Calculate spherical caps
- Colorization
⇒ Profile Extension Add-On*
Adds support for profilometry, including:
- Calculate roughness and surface texture
- Data corrections (outliers, defects and noise)
- Analyze surface geometry
*Only available as an add-on for Wiley Surface-to-Spectral Analysis Enhanced Edition (more information provided below)
Wiley Surface-to-Spectral Analysis – Enhanced Edition
A premium Wiley Surface-to-Spectral Analysis – Enhanced Edition package is also available.
It includes the features found in the basic package plus these add-ons:
- Particle Analysis and SPM add-ons (see details above)
- Chemical Cubes add-on:
Full visualization and analysis of multi-channel cubes for compositional data:- Associate tomography and chemical analysis of materials in full 3D
- Access to a wide range of visualization and animation settings for the 3D cube
- Extract slices as color images
- Produce particle and grain statistics
Package Comparison
| Basic Package | Enhanced Edition | ||
| Support for Various Techniques | Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF | X | X |
| Hyperspectral image support | Raman, IR, UV-Vis | X | X |
| SPM | Force Microscopy (AFM, STM) | Add-On | X |
| Particle Analysis | Toolkit for images containing particle shapes | Add-On | X |
| Chemical Cubes | 3D multichannel cube generation from 2D data | Not Available | X |
| SEM | SEM | Add-On | Add-On |
| Profiler Extension | Profilometry | Not Available | Add-On |
| KnowItAll Software & Libraries | NOTE: Relevant KnowItAll spectral databases currently supported in this workflow: IR, Raman, UV-Vis | Add-On | Add-On |
Compatibility
Supports a wide range of file formats for seamless integration into your current workflow
The Wiley Surface-to-Spectral Analysis – Basic Package supports the following file formats.
| Spectroscopy |
| Attolight: Cathodoluminescence hypercubes |
| Anasys Instruments: NanoIR (*.axd, *.axz) |
| Bruker: Spectra and Hypercubes (*.0) |
| CS Instruments (*.nao) |
| Delmic: HDF5 Hypercubes (*.h5) |
| Edax: SPD Hypercubes (*.spd) |
| Flexible Image Transport System: Photon Etc (*.fits) |
| Gatan: Digital Micrograph 3 and 4 (*.dm3, *.dm4) |
| Harris Geospatial: ENVI software files (*.hdr) |
| Horiba: LabSpec 6 software files (*.h5, *.hdf5) |
| IGOR Wavemetrix: IBW (*.ibw) |
| Leica: Image file (*.lif, *.xlef, *.xlif, *.xllf, *.xlcf) |
| NT-MDT: Raman Hypercubes (*.mdt) |
| Oxford Instruments (Witec): H5OIWT (*.ardf, *.h5, *.hdf5, *.h5ebsd, *.h5oina, *.h5oiwt) |
| Photothermal (CytoSpec): ASCII file for mIRage (*.hvi) |
| Specs: 3DS Hypercubes (*.3ds) |
| Thermo Fisher: Advantage (*.vgd) |
| Thermo Fisher: Galactic (*.spc) |
| Thermo Fisher: OMNICxi MAPX file (*.mapx) |
| Tokyo Instruments (*.smd, *.s1d) |
| Scanning Electron Microscopes |
| Medical Research Council, UK: MRC (*.mrc, *.map) |
| Zeiss: Evo, Sigma, Merlin (*.sem3d, *.czi, *.zvi) |
| Generic & Other Manufacturing formats |
| Generic text file (ASCII, Unicode): 1D, 2D, 3D support. Note: Upon opening, a dialog will appear to specify how the data in the file is organized (*.txt, *.asc, *.dat) |
| Generic CSV format (*.csv) |
| Mountains: profiles and surfaces (*.pro, *.sur) |
| OBJ format(*.obj) |
| Omicron: SCALA (*.par) |
| Omicron: Matrix (*.mtrx, *_mtrix) |
| Polygon File format (*.ply) |
| STL/Triangulated surfaces (Stereo Lithography Format): An STL studiable can be imported as a shell or as a surface (*.stl) |
| Universal data file (SDF) (*.sdf) |
| Image formats |
| Windows Bitmap image (*.bmp) |
| EMF image (*.emf) |
| GIF image (*.gif) |
| JPEG image (*.jpg, *.jpeg) |
| PNG image (*.png) |
| TIFF image (*.tif, *.tiff) |
| TIFF surface (*.tif, *.tiff) |
| WMF image (*.wmf) |
Support for the file formats listed below is included for SPM add-on, when paired to the main configuration of Wiley Surface-to-Spectral Analysis.
| 2D/3D Profilometers (contact and non-contact) |
| Digital Surf (*.pro, *.sur, *.spro, *.ssur, *.disc) |
| Confocal, Interference and Focus variation Microscopes |
| NanoSystem: NanoView WLI (*.spm) |
| Scanning Probe Microscopes |
| AFMWorkshop (*.csv, *.wsf) |
| Agilent Technologies/Keysight: All AFMs, PicoMap (*.stp, *.mi, *.ivs) |
| Anfatec Instruments AG (*.txt) |
| Attocube (*.bcrf, *.bcr) |
| Anasys Instruments: NanoIR, AFM, SNOM (*.axd, *.axz) |
| APE Research (*.dat) |
| CSM Instruments/Anton Paar: NanoIndenter (*.sis) |
| Gwyddion: GSF Format (simple Fields), GWY format, DUMP format (*.gsf, *.gwy, *.dump) |
| Hitachi: Finetech AFM (*.afm, *.afp) |
| Image Metrology: BCR-STM format (*.bcr) |
| JPK: surfaces (*.jpk, *.jpk-qi-image, *.force) |
| JPK: force surves (*.jpk-force, *.jpk-force-map, *.jpk-qi-data) |
| Nanonics: MultiView (*.nan) |
| Nanonis: DAT (*.dat, *.sxm) |
| Nanoscan: PPMS-AFM (*.xml) |
| Nanosurf: Nanite, EasyScan, Nanosurf Report (*.ezd, *.nid) |
| NT-MDT: NTegra, Solver (*.mdt) |
| Omicron (*.flat) |
| Oxford Instruments (*.hdf5, *.ardf, *.h5ebsde, *.h5oina) |
| Park Systems/PSIA: XE series, PS-PTT (*.tif, *.ps-ppt) |
| Quesant/Ambios: Q-Scope (*.afm, *.txt) |
| RHK (*.sm3, *.sm4) |
| SII Nanotechnology: Nanopics, SPA-Series (*.xqt) |
Wiley Surface-to-Spectral Analysis – Enhanced Edition supports the file formats listed above for the main product configuration, plus these additional formats.
| Spectroscopy |
| Igor Binary Wave (*.ibw) |
| Specs: 3DS Hypercubes (*.3ds) |
| 2D/3D Profilometers (contact and non-contact) |
| Digital Surf (*.pro, *.sur, *.spro, *.ssur, *.disc) |
| Confocal, Interference and Focus variation Microscopes |
| NanoSystem: NanoView WLI (*.spm) |
| Scanning Probe Microscopes |
| AFMWorkshop (*.csv, *.wsf) |
| Agilent Technologies/Keysight: All AFMs, PicoMap (*.stp, *.mi, *.ivs) |
| Anfatec Instruments AG (*.txt) |
| Attocube (*.bcrf, *.bcr) |
| Anasys Instruments: NanoIR, AFM, SNOM (*.axd, *.axz) |
| APE Research (*.dat) |
| CSM Instruments/Anton Paar: NanoIndenter (*.sis) |
| Gwyddion: GSF Format (simple Fields), GWY format, DUMP format (*.gsf, *.gwy, *.dump) |
| Hitachi: Finetech AFM (*.afm, *.afp) |
| Image Metrology: BCR-STM format (*.bcr) |
| JPK: surfaces (*.jpk, *.jpk-qi-image, *.force) |
| JPK: force surves (*.jpk-force, *.jpk-force-map, *.jpk-qi-data) |
| Nanonics: MultiView (*.nan) |
| Nanonis: DAT (*.dat, *.sxm) |
| Nanoscan: PPMS-AFM (*.xml) |
| Nanosurf: Nanite, EasyScan, Nanosurf Report (*.ezd, *.nid) |
| NT-MDT: NTegra, Solver (*.mdt) |
| Omicron (*.flat) |
| Oxford Instruments (*.hdf5, *.ardf, *.h5ebsde, *.h5oina) |
| Park Systems/PSIA: XE series, PS-PTT (*.tif, *.ps-ppt) |
| Quesant/Ambios: Q-Scope (*.afm, *.txt) |
| RHK (*.sm3, *.sm4) |
| SII Nanotechnology: Nanopics, SPA-Series (*.xqt) |
Support for the file formats listed below is included for Profiler Extension add-on, when paired to the Wiley Surface-to-Spectral Analysis – Enhanced Edition.
| 2D/3D Profilometers (contact and non-contact) |
| Accretech/TSK: Surfcom Series (*.rs3, *.s3d) |
| Ametek: see Taylor Hobson below |
| Digital Metrology: Omnisurf software (*.sig) |
| Hommel-Etamic/Hommelwerke: Wavespeed, Turbo Profil software, T8000, NanoSwing, HommelMap (*.pip, *.top, *.hwp, *.hwh, *.xml) |
| KLA-Tencor: P-16+, P-Series, Alpha-Step IQ, Alpha-Step 500, Nanopics, Apex (*.3dd, *.dat, *.rwb, *.rwt, *.map, *.amb, *.xml, *.wli) |
| Mahr: Perthometer Concept (*.pcd, *.prf) |
| Mitaka Kohki: NH series, MitakaMap (*.am2, *.am3) |
| Mitutoyo: SV-Series, CS-Series (*.udf, *.sja, *.rcb, *.pra) |
| NanoFocus: LaserScan, µScan, µSoft (*.oms, *.nms, *.sur) |
| Nikon: Nexiv VMR (*.csv, *.asc) |
| Optimet: ConoScan (*.job) |
| Scantron: ProScan (*.prn) |
| Somicronic/Hommel: SurfaScan (*.pro, *.mes) |
| Taylor Hobson: TalySurf CLI, Form TalySurf Series, Ultra software, TalyMap, TalyProfile, TalyScan, Surtronic, TalyStep, Nanostep, PGI Novus (*.map, *.mod, *.prf, *.pro, *.sur, *.str, *.sth) |
| UBM: MicroFocus (*.ub2, *.ub3, *.ua2, *.ua3) |
| Confocal, Interference and Focus variation Microscopes |
| 4D Technology (*.h5) |
| ADE Phase Shift/KLA-Tencor: MicroXAM (*.map, *.mat) |
| Alicona: InfiniteFocus, MeX (*.al3d, *.alrl3d) |
| Helicon: Focus variation files (*.h3d) |
| Hirox: Digital Microscopes (*.csv, *.tdr) |
| Keyence: Digital Microscopes (*.map, *vk3, *vk4) |
| Lasertec: Optelics series (*.lms) |
| Leica: DCM 3D, DVM (*.xml, *.jpg, *.tif) |
| Lyncée-Tec: (*.dhm, *.bin) |
| Nikon: Eclipse C1, Nexiv confocal and VMZ, BW-H (*.ics, *.raw, *.sdf) |
| Olympus: LEXT (*.ols, *.lext) |
| Sensofar: APX format (*.apx) |
| Sensofar: PLµ series (*.plu) |
| Siemens: SIScan MC64 Topographer (*.sip) |
| Wyko: NT series (Bruker) (*.opd) |
| Zeiss MicroImaging: LSM (*.lsm) |
| Zemetrics: ZeGage (*.zmp) |
| Zeta Instruments (*.zmg) |
| Zygo: NewView series (*.dat, *.datx) |
| Scanning Probe Microscopes |
| RIBM: MS-NEX (*.asd) |
| Topometrix (*.tfr, *.zfr) |
| Generic and Additive Manufacturing formats |
| ISO 5436-2: Softgauge Standard (*.smd) |
| Open GPS (X3P): Open GPS XML format (ISO 25178-72) (*.x3p) |
| Other Instruments and formats |
| 3D Shape: µKorad 3D (*.ki) |
| Visuol Technologies/Techlab: Ondulo (*.res) |
System Requirements
- Operating systems: Windows 10, 64 bits
- Recommended processor:
- standard use: multi-core processor
- intensive use*: multiple multi-core processors
- Disk: Minimum: 1 Gb of hard drive free space
- RAM:
- Minimum: 4GB
- Recommended: 8GB
- Recommended for intensive use*: 32GB
- Graphics:
- Minimum: OpenGL 2.0 or Direct X 9.0c support
- Recommended: Dedicated GPU 1 Gb
- Screen resolution:
- Minimum: 1280×768
- Recommended: Full HD
- Intensive use is considered:
- 3D SEM reconstruction with images bigger than 8 Megapixels
- Surface data files bigger than 8000×8000 points
- Large series of images/surfaces
- Can not install on a network computer
Ordering Information
Please contact us directly if you need additional information or a quote.
| Product Code | Product | Format |
| 978EALDB05871 | Wiley Surface-to-Spectral Analysis – Basic Package | Download |
| 978EALDB06151 | Wiley Surface-to-Spectral Analysis – Enhanced Edition | Download |
| 978EALDB06342 | Wiley Surface-to-Spectral Analysis with Particle Analysis Add-On (Bundle) | Download |
| 978EALDB06359 | Wiley Surface-to-Spectral Analysis with SPM Add-On (Bundle) | Download |
| 978EALDB06366 | Wiley Surface-to-Spectral Analysis with SEM Add-On (Bundle) | Download |
| 978EALDB06373 | Wiley Surface-to-Spectral Analysis with Profiler Extension Add-On (Bundle) | Download |
| 978EALDB06168 | Particle Analysis Add-On | Download |
| 978EALDB06175 | SPM Add-On | Download |
| 978EALDB06182 | SEM Add-On | Download |
| 978EALDB06199 | Profiler Extension Add-On | Download |
Maintenance plans also available to ensure you are up to date with the latest software.