Wiley Surface-to-Spectral Analysis

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概述

适用于显微镜分析的全套关联分析和光谱分析软件解决方案

从显微镜分析到光谱分析，一个工作流程全搞定

全新 Wiley Surface-to-Spectral Analysis 为处理、组合和分析各种显微技术生成的图像和数据提供了全面、强大的解决方案。所有工作一个界面全搞定，只为提升您的实验室效率：

  • 光谱处理和分析
  • 光谱图和图像处理
  • 关联分析
  • 二维成分数据的三维可视化

用户甚至可以将光谱发送到 Wiley 的 KnowItAll 软件*，对照光谱库进行检索，进一步进行分析。

全面的一体化工具，实现高效分析

灵活兼容各类供应商，轻松集成

只需一个工作流程，更快挖掘出重要见解

Comprehensive Compound Coverage.

 

强大的工具组合，确保您能够详尽处理和分析表面图像。

Trusted Data from a Trusted Source.

 

支持多种文件和仪器格式，即使更换了仪器或显微镜，您的工作流程也无需改动。

Supports Multiple MS Instruments & Vendor Formats.

 

从显微镜分析直接进入光谱分析——所有工作一个工作流程全搞定，让您更快地得出结论。

支持的技术包括：

  • 拉曼
  • 针尖增强拉曼
  • 红外
  • 纳米红外
  • 荧光
  • 光致发光
  • 阴极发光
  • EDX/EDS和XPS
  • 配有用于 SEM、SPM、颗粒分析和轮廓测定的附加组件

有关支持格式的列表，请参见兼容性标签页。

 

* 需要 KnowItAll 软件和数据库许可证。

详细信息

以下是每个软件包所含所有功能的详细信息。

Wiley Surface-to-Spectral Analysis – Basic Package

主要功能

⇒ 光谱处理和分析

  • 光谱系列和高光谱图像可视化和分析
  • 根据用户选择的光谱带创建光谱图
  • 生成参数图
  • 应用多变量分析查找重要光谱及其分布情况
  • 处理方法包括：基线校正、滤波、峰值拟合
  • 一键点击即可将光谱发送到 KnowItAll IDExpert* 数据库中进行搜索，包括拉曼光谱、红外光谱（傅立叶变换红外光谱、衰减全反射光谱、近红外光谱）和紫外可见光谱数据库

*需要 KnowItAll 软件和数据库许可证。

⇒ 光谱图和图像处理

  • 处理拉曼、阴极发光、光致发光、荧光、EDX/EDS（能量色散 X 射线光谱）和 EELS（电子能量损失光谱）的光谱图
  • 光谱图的处理方法包括：图层混色、调整图像噪声、调整图层之间的透明度
  • 图像处理方法包括：应用视觉修正和增强、平滑、去除伪影

⇒ 关联分析

  • 将单台仪器或多台仪器（拉曼、EDS/EDX、阴极荧光、荧光等）的图像和光谱图关联起来
  • 将不同来源的信息合并成一个单一的、多层面的数据集

Figure: Correlation of 2D microscopy images into a 3D visualization.

⇒ 二维成分数据的三维可视化

  • 通过关联显微图像或地形数据，创建二维化学图的三维可视化效果

附加组件：产品增强及对其他显微分析的支持

以下附加组件可支持其他显微分析。请参见

⇒ SEM 附加组件

支持扫描电子显微镜 (SEM) 图像：

    • 特征分组着色
    • 图像修正和增强
    • 精确计算高度和表面粗糙度
    • 根据图像生成 3D 效果图
    • 将 EDX/EDS 数据与图像相关联

Figure: SEM colorization of particles using SEM add-on functionality

⇒ SPM 附加组件

SPM 支持扫描探针显微镜（STM、AFM 等）文件格式和多通道数据：

    • 高级处理（逐行调平、空间滤波器、表面分割、尖端解卷积、线校正、多平面调平）
    • 数学函数运算符

Figure: Step height analysis using SPM add-on

⇒ 颗粒分析附加组件

颗粒分析为分析结构化表面上的颗粒、孔隙、晶粒、岛屿等提供了全面的工具集：

    • 基于不同分割原理的特征检测
    • 根据形状、高度或大小对颗粒进行分组
    • 计算球冠
    • 着色

Figure: Particle Analysis add-on

⇒ 轮廓扩展附加组件*

增加对轮廓测定的支持，包括：

    • 计算粗糙度和表面纹理
    • 数据校正（异常值、缺陷和噪音）
    • 分析表面几何形状

*仅作为 Wiley Surface-to-Spectral Analysis Enhanced Edition 的附加组件提供（更多信息见下文）

Wiley Surface-to-Spectral Analysis – Enhanced Edition

也可提供 Wiley Surface-to-Spectral Analysis – Enhanced Edition 高端软件包。

该软件包包含 Basic Package 中的功能以及这些附加组件：

  • 颗粒分析和 SPM 附加组件（详见上文）
  • 化学立方体附加组件：
    成分数据多通道立方体的全面可视化和分析：

    • 在全三维环境中将材料的体层摄影和化学分析结合起来
    • 可对三维立方体进行多种可视化和动画设置
    • 提取切片作为彩色图像
    • 生成颗粒和晶粒统计数据

      Figure: Generated 3D multi-channel cube

 

软件包比较

 Basic PackageEnhanced Edition
支持各种技术拉曼、针尖增强拉曼、红外、纳米红外、荧光、光致发光、阴极发光、EDX/EDS、XRFXX
高光谱图像支持拉曼、红外、紫外可见光XX
SPM力显微分析（AFM、STM）附加组件X
颗粒分析含颗粒形状图像工具包附加组件X
化学立方体从二维数据生成三维多层立方体不可用X
SEMSEM附加组件附加组件
轮廓仪扩展轮廓测定不可用附加组件
KnowItAll 软件和数据库注意：本工作流程目前支持的相关 KnowItAll 光谱数据库：红外光谱、拉曼光谱、紫外可见光谱附加组件附加组件

兼容性

支持多种文件格式，可无缝集成到您当前的工作流程中

The Wiley Surface-to-Spectral Analysis – Basic Package supports the following file formats.

Spectroscopy
Attolight: Cathodoluminescence hypercubes
Anasys Instruments: NanoIR (*.axd, *.axz)
Bruker: Spectra and Hypercubes (*.0)
CS Instruments (*.nao)
Delmic: HDF5 Hypercubes (*.h5)
Edax: SPD Hypercubes (*.spd)
Flexible Image Transport System: Photon Etc (*.fits)
Gatan: Digital Micrograph 3 and 4 (*.dm3, *.dm4)
Harris Geospatial: ENVI software files (*.hdr)
Horiba: LabSpec 6 software files (*.h5, *.hdf5)
IGOR Wavemetrix: IBW (*.ibw)
Leica: Image file (*.lif, *.xlef, *.xlif, *.xllf, *.xlcf)
NT-MDT: Raman Hypercubes (*.mdt)
Oxford Instruments (Witec): H5OIWT (*.ardf, *.h5, *.hdf5, *.h5ebsd, *.h5oina, *.h5oiwt)
Photothermal (CytoSpec): ASCII file for mIRage (*.hvi)
Specs: 3DS Hypercubes (*.3ds)
Thermo Fisher: Advantage (*.vgd)
Thermo Fisher: Galactic (*.spc)
Thermo Fisher: OMNICxi MAPX file (*.mapx)
Tokyo Instruments (*.smd, *.s1d)
Scanning Electron Microscopes
Medical Research Council, UK: MRC (*.mrc, *.map)
Zeiss: Evo, Sigma, Merlin (*.sem3d, *.czi, *.zvi)
Generic & Other Manufacturing formats
Generic text file (ASCII, Unicode): 1D, 2D, 3D support. Note: Upon opening, a dialog will appear to specify how the data in the file is organized (*.txt, *.asc, *.dat)
Generic CSV format (*.csv)
Mountains: profiles and surfaces (*.pro, *.sur)
OBJ format(*.obj)
Omicron: SCALA (*.par)
Omicron: Matrix (*.mtrx, *_mtrix)
Polygon File format (*.ply)
STL/Triangulated surfaces (Stereo Lithography Format): An STL studiable can be imported as a shell or as a surface (*.stl)
Universal data file (SDF) (*.sdf)
Image formats
Windows Bitmap image (*.bmp)
EMF image (*.emf)
GIF image (*.gif)
JPEG image (*.jpg, *.jpeg)
PNG image (*.png)
TIFF image (*.tif, *.tiff)
TIFF surface (*.tif, *.tiff)
WMF image (*.wmf)

Support for the file formats listed below is included for SPM add-on, when paired to the main configuration of Wiley Surface-to-Spectral Analysis.

2D/3D Profilometers (contact and non-contact)
Digital Surf (*.pro, *.sur, *.spro, *.ssur, *.disc)
Confocal, Interference and Focus variation Microscopes
NanoSystem: NanoView WLI (*.spm)
Scanning Probe Microscopes
AFMWorkshop (*.csv, *.wsf)
Agilent Technologies/Keysight: All AFMs, PicoMap (*.stp, *.mi, *.ivs)
Anfatec Instruments AG (*.txt)
Attocube (*.bcrf, *.bcr)
Anasys Instruments: NanoIR, AFM, SNOM (*.axd, *.axz)
APE Research (*.dat)
CSM Instruments/Anton Paar: NanoIndenter (*.sis)
Gwyddion: GSF Format (simple Fields), GWY format, DUMP format (*.gsf, *.gwy, *.dump)
Hitachi: Finetech AFM (*.afm, *.afp)
Image Metrology: BCR-STM format (*.bcr)
JPK: surfaces (*.jpk, *.jpk-qi-image, *.force)
JPK: force surves (*.jpk-force, *.jpk-force-map, *.jpk-qi-data)
Nanonics: MultiView (*.nan)
Nanonis: DAT (*.dat, *.sxm)
Nanoscan: PPMS-AFM (*.xml)
Nanosurf: Nanite, EasyScan, Nanosurf Report (*.ezd, *.nid)
NT-MDT: NTegra, Solver (*.mdt)
Omicron (*.flat)
Oxford Instruments (*.hdf5, *.ardf, *.h5ebsde, *.h5oina)
Park Systems/PSIA: XE series, PS-PTT (*.tif, *.ps-ppt)
Quesant/Ambios: Q-Scope (*.afm, *.txt)
RHK (*.sm3, *.sm4)
SII Nanotechnology: Nanopics, SPA-Series (*.xqt)

Wiley Surface-to-Spectral Analysis – Enhanced Edition supports the file formats listed above for the main product configuration, plus these additional formats.

Spectroscopy
Igor Binary Wave (*.ibw)
Specs: 3DS Hypercubes (*.3ds)
2D/3D Profilometers (contact and non-contact)
Digital Surf (*.pro, *.sur, *.spro, *.ssur, *.disc)
Confocal, Interference and Focus variation Microscopes
NanoSystem: NanoView WLI (*.spm)
Scanning Probe Microscopes
AFMWorkshop (*.csv, *.wsf)
Agilent Technologies/Keysight: All AFMs, PicoMap (*.stp, *.mi, *.ivs)
Anfatec Instruments AG (*.txt)
Attocube (*.bcrf, *.bcr)
Anasys Instruments: NanoIR, AFM, SNOM (*.axd, *.axz)
APE Research (*.dat)
CSM Instruments/Anton Paar: NanoIndenter (*.sis)
Gwyddion: GSF Format (simple Fields), GWY format, DUMP format (*.gsf, *.gwy, *.dump)
Hitachi: Finetech AFM (*.afm, *.afp)
Image Metrology: BCR-STM format (*.bcr)
JPK: surfaces (*.jpk, *.jpk-qi-image, *.force)
JPK: force surves (*.jpk-force, *.jpk-force-map, *.jpk-qi-data)
Nanonics: MultiView (*.nan)
Nanonis: DAT (*.dat, *.sxm)
Nanoscan: PPMS-AFM (*.xml)
Nanosurf: Nanite, EasyScan, Nanosurf Report (*.ezd, *.nid)
NT-MDT: NTegra, Solver (*.mdt)
Omicron (*.flat)
Oxford Instruments (*.hdf5, *.ardf, *.h5ebsde, *.h5oina)
Park Systems/PSIA: XE series, PS-PTT (*.tif, *.ps-ppt)
Quesant/Ambios: Q-Scope (*.afm, *.txt)
RHK (*.sm3, *.sm4)
SII Nanotechnology: Nanopics, SPA-Series (*.xqt)

Support for the file formats listed below is included for Profiler Extension add-on, when paired to the Wiley Surface-to-Spectral Analysis – Enhanced Edition.

2D/3D Profilometers (contact and non-contact)
Accretech/TSK: Surfcom Series (*.rs3, *.s3d)
Ametek: see Taylor Hobson below
Digital Metrology: Omnisurf software (*.sig)
Hommel-Etamic/Hommelwerke: Wavespeed, Turbo Profil software, T8000, NanoSwing, HommelMap (*.pip, *.top, *.hwp, *.hwh, *.xml)
KLA-Tencor: P-16+, P-Series, Alpha-Step IQ, Alpha-Step 500, Nanopics, Apex (*.3dd, *.dat, *.rwb, *.rwt, *.map, *.amb, *.xml, *.wli)
Mahr: Perthometer Concept (*.pcd, *.prf)
Mitaka Kohki: NH series, MitakaMap (*.am2, *.am3)
Mitutoyo: SV-Series, CS-Series (*.udf, *.sja, *.rcb, *.pra)
NanoFocus: LaserScan, µScan, µSoft (*.oms, *.nms, *.sur)
Nikon: Nexiv VMR (*.csv, *.asc)
Optimet: ConoScan (*.job)
Scantron: ProScan (*.prn)
Somicronic/Hommel: SurfaScan (*.pro, *.mes)
Taylor Hobson: TalySurf CLI, Form TalySurf Series, Ultra software, TalyMap, TalyProfile, TalyScan, Surtronic, TalyStep, Nanostep, PGI Novus (*.map, *.mod, *.prf, *.pro, *.sur, *.str, *.sth)
UBM: MicroFocus (*.ub2, *.ub3, *.ua2, *.ua3)
Confocal, Interference and Focus variation Microscopes
4D Technology (*.h5)
ADE Phase Shift/KLA-Tencor: MicroXAM (*.map, *.mat)
Alicona: InfiniteFocus, MeX (*.al3d, *.alrl3d)
Helicon: Focus variation files (*.h3d)
Hirox: Digital Microscopes (*.csv, *.tdr)
Keyence: Digital Microscopes (*.map, *vk3, *vk4)
Lasertec: Optelics series (*.lms)
Leica: DCM 3D, DVM (*.xml, *.jpg, *.tif)
Lyncée-Tec: (*.dhm, *.bin)
Nikon: Eclipse C1, Nexiv confocal and VMZ, BW-H (*.ics, *.raw, *.sdf)
Olympus: LEXT (*.ols, *.lext)
Sensofar: APX format (*.apx)
Sensofar: PLµ series (*.plu)
Siemens: SIScan MC64 Topographer (*.sip)
Wyko: NT series (Bruker) (*.opd)
Zeiss MicroImaging: LSM (*.lsm)
Zemetrics: ZeGage (*.zmp)
Zeta Instruments (*.zmg)
Zygo: NewView series (*.dat, *.datx)
Scanning Probe Microscopes
RIBM: MS-NEX (*.asd)
Topometrix (*.tfr, *.zfr)
Generic and Additive Manufacturing formats
ISO 5436-2: Softgauge Standard (*.smd)
Open GPS (X3P): Open GPS XML format (ISO 25178-72) (*.x3p)
Other Instruments and formats
3D Shape: µKorad 3D (*.ki)
Visuol Technologies/Techlab: Ondulo (*.res)

系统要求

  • Operating systems: Windows 10, 64 bits
  • Recommended processor: 
    • standard use: multi-core processor
    • intensive use*: multiple multi-core processors
  • Disk: Minimum: 1 Gb of hard drive free space
  • RAM:
    • Minimum: 4GB
    • Recommended: 8GB
    • Recommended for intensive use*: 32GB
  • Graphics:
    • Minimum: OpenGL 2.0 or Direct X 9.0c support
    • Recommended: Dedicated GPU 1 Gb
  • Screen resolution:
    • Minimum: 1280×768
    • Recommended: Full HD
  • Intensive use is considered:
    • 3D SEM reconstruction with images bigger than 8 Megapixels
    • Surface data files bigger than 8000×8000 points 
    • Large series of images/surfaces
  • Can not install on a network computer

订购信息

如需更多信息或报价，请直接与我们联系。

产品代码产品格式
978EALDB05871Wiley Surface-to-Spectral Analysis – Basic PackageDownload
978EALDB06151​Wiley Surface-to-Spectral Analysis – Enhanced EditionDownload
978EALDB06342Wiley Surface-to-Spectral Analysis with Particle Analysis Add-On (Bundle)Download
978EALDB06359Wiley Surface-to-Spectral Analysis with SPM Add-On (Bundle)Download
978EALDB06366Wiley Surface-to-Spectral Analysis with SEM Add-On (Bundle)Download
978EALDB06373Wiley Surface-to-Spectral Analysis with Profiler Extension Add-On (Bundle)Download
978EALDB06168​Particle Analysis Add-On​Download
978EALDB06175SPM Add-OnDownload
978EALDB06182SEM Add-OnDownload
978EALDB06199Profiler Extension Add-OnDownload

Maintenance plans also available to ensure you are up to date with the latest software.